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dc.contributor.authorKesseler, E.en_US
dc.date.accessioned2017-02-03T13:10:14Z
dc.date.available2017-02-03T13:10:14Z
dc.date.issued1999en_US
dc.identifier.otherNLR-TP-1999-272en_US
dc.identifier.urihttp://hdl.handle.net/10921/1137
dc.language.isonlen_US
dc.publisherNational Aerospace Laboratory NLRen_US
dc.relation.ispartofseriesNLR Technical Publication;1999-272en_US
dc.subject.otherEmbedded systemsen_US
dc.subject.otherAvionicsen_US
dc.titleQuality first - Measuring a safety-critical embedded software development process -en_US


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